NIMS and the University of Queensland Centre for Microscopy and Microanalysis, the Dalian Polytechnic University, and the Dalian Institute of Chemical Physics, Chinese Academy of Science, clarified for the first time the cluster structure which has an extremely large effect on the long-term stability of solid oxide fuel cells (SOFC) for independent distributed power generation.
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Tag Archives: microscopy
Feed SubscriptionMapping deformation in buried semiconductor structures using the hard X-Ray nanoprobe
(PhysOrg.com) -- Scientists from IBM's T. J. Watson Research Center and Columbia University, working with the X-Ray Microscopy Group, have mapped rotation and strain fields across a silicon-on-insulator (SOI) structure that included a liner of stressed Si3N4 using X-ray nanodiffraction (nano-XRD) at the CNM/APS Hard X-Ray Nanoprobe beamline.
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