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Spin-orbit sum rule to speed up X-ray scattering research

A new theory developed by Prof Gerrit van der Laan, from the Science & Technology Facilities Council (STFC) and Diamond Light Source, and published this week in the journal Physical Review Letters, provides a powerful sum rule that scientists can use to explore the properties of novel materials, such as those used for spintronics devices.

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How Biometrics Helped to Identify the Master Terrorist

When the U.S. military attacked Iraq in March 2003, it brought to bear the most advanced technology then available for identifying potential terrorists by their physical features. The equipment measured all sorts of physical features--from fingerprints to images of the retina--but it was not particularly easy to use.

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